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StepCommander
Stepping Management Software
StepCommander is a software utility that generates stepping patterns for wafers to be probed and/or tested. Die can be manually selected or un-selected for test, or Step Commander can be used for complex stepping patterns.
StepCommander
features include:
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Support for custom probe / test (for example, probing every third die)
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Support for partial wafer probe / test
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Management of die start, die alignment, and the die coordinate system in the ProbeCommander environment
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Easy-to-use setup wizard
StepCommander Wafer Template
StepCommander is a member of the ProbeCommander Software Suite of applications from Pacific Western System, Inc. ProbeCommander controls all of the elements of probing and testing systems - including imaging, positioning, alignment, stepping, mapping, lot, and data management services.